Short Courses

Following recent successful workshops on uncertainties in microwave measurements, from Microwave Week 2006, 2008 and European Microwave Week 2007-2009, this workshop will continue presenting more practical information on evaluating accuracy of measurements made at RF and microwave frequencies.

In particular, this workshop will be built on the idea of demonstrating a top-down approach for evaluating uncertainty of measured values. Also, it will give an update on the latest achievements in this field.

This event will have two sessions: "General Questions of Uncertainty in Microwave Measurements" and "Measurement Uncertainty in On-Wafer Applications". It will be wrapped up by a roundtable discussion reviewing all talks that have taken place during the workshop. This will give participants ample opportunity to discuss aspects of this subject that are currently of interest to them.

This workshop is endorsed by MTT-11 "Microwave Measurements Committee" of the MTT-S Technical Coordinating Committee.

Nick M. Ridler (IEEE SM'06) received the B.Sc. degree from the University of London, London, U.K., in 1981.

He has spent more than 25 years working in both industrial and government scientific research laboratories. He is currently with the National Physical Laboratory, Teddington, U.K., where he is responsible for RF and microwave measurement activities, including managing the national standard facilities for vector network analyzer measurements. His current research interests include measurements at millimeter wavelengths (to 300 GHz and beyond), RF printed circuit-board measurements, and the evaluation of the uncertainty of measurements.

Andrej Rumiantsev (IEEE M'04) was born in Minsk, Belarus in 1972. He received the Dip.-Eng. degree (with highest honors) in telecommunication systems from the Belarusian State University of Informatics and Radio Electronics (BSUR) in Minsk, Belarus, in 1994. After finishing the three-year post-graduate program in electrical engineering, he joined the Chair of Telecommunication systems of BSUIR as research and teaching assistant in year 1997.

In 2001 joined SUSS MicroTec Test Systems in Dresden, Germany. At SUSS, he has held positions in application engineering, software engineering and product management. Currently, he is the Applications Group Manager. Since 2006, he has continued his work towards a doctoral degree at the Technische Universität Dresden (Dresden University of Technology). His research interests are focused on the accuracy improvement of calibration and wafer-level measurement techniques for next-generation RF and Microwave semiconductor devices.